Note: Using fast digitizer acquisition and flexible resolution to enhance noise cancellation for high performance nanosecond transient absorbance spectroscopy A. Rimshaw, C. Grieco, and J. B. Asbury
Citation: Review of Scientific Instruments 86, 066107 (2015); doi: 10.1063/1.4923093 View online: http://dx.doi.org/10.1063/1.4923093 View Table of Contents: http://aip.scitation.org/toc/rsi/86/6 Published by the American Institute of Physics
REVIEW OF SCIENTIFIC INSTRUMENTS 86, 066107 (2015)
Note: Using fast digitizer acquisition and flexible resolution to enhance noise cancellation for high performance nanosecond transient absorbance spectroscopy A. Rimshaw,a) C. Grieco,a) and J. B. Asburyb) Department of Chemistry, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
(Received 23 March 2015; accepted 15 June 2015; published online 24 June 2015) We demonstrate a nanosecond transient absorbance spectrometer that utilizes flexible resolution and rapid data acquisition triggering modes. The instrument features signal-to-noise (S/N) levels enhanced by an order of magnitude especially within the first 100 ns. The primary gain in S/N comes from our sequential subtraction method, which requires a fast digitizer trigger rearm time to detect every laser trigger event. C 2015 AIP Publishing LLC. [http://dx.doi.org/10.1063/1.4923093]
The technique of nanosecond transient absorption spectroscopy (laser flash photolysis) has existed since the 1960s,1–3 and now plays a large role in fundamental and applied studies of emerging electronic materials. Transient absorption spectroscopy is capable of measuring the dynamics of excited state populations including excitons and charge carriers through ground state bleach recovery and other nanosecond processes. The enormous growth of the electronic materials field has greatly increased the demand for instrumentation with high sensitivity to measure the small signals associated with photophysical processes in thin (
Citation: Review of Scientific Instruments 86, 066107 (2015); doi: 10.1063/1.4923093 View online: http://dx.doi.org/10.1063/1.4923093 View Table of Contents: http://aip.scitation.org/toc/rsi/86/6 Published by the American Institute of Physics
REVIEW OF SCIENTIFIC INSTRUMENTS 86, 066107 (2015)
Note: Using fast digitizer acquisition and flexible resolution to enhance noise cancellation for high performance nanosecond transient absorbance spectroscopy A. Rimshaw,a) C. Grieco,a) and J. B. Asburyb) Department of Chemistry, The Pennsylvania State University, University Park, Pennsylvania 16802, USA
(Received 23 March 2015; accepted 15 June 2015; published online 24 June 2015) We demonstrate a nanosecond transient absorbance spectrometer that utilizes flexible resolution and rapid data acquisition triggering modes. The instrument features signal-to-noise (S/N) levels enhanced by an order of magnitude especially within the first 100 ns. The primary gain in S/N comes from our sequential subtraction method, which requires a fast digitizer trigger rearm time to detect every laser trigger event. C 2015 AIP Publishing LLC. [http://dx.doi.org/10.1063/1.4923093]
The technique of nanosecond transient absorption spectroscopy (laser flash photolysis) has existed since the 1960s,1–3 and now plays a large role in fundamental and applied studies of emerging electronic materials. Transient absorption spectroscopy is capable of measuring the dynamics of excited state populations including excitons and charge carriers through ground state bleach recovery and other nanosecond processes. The enormous growth of the electronic materials field has greatly increased the demand for instrumentation with high sensitivity to measure the small signals associated with photophysical processes in thin (
